Advances in metrology for x-ray and EUV optics : 2-3 August, 2005, San Diego, California, USA Lahsen Assoufid, Peter Z. Takacs, John S. Taylor, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, Wash SPIE c2005Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 ASS (Browse shelf(Opens below))	Available		424247

Includes bibliographical references and author index

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