Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA Angela Duparré, Bhanwar Singh, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.]

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Publication details: Bellingham, Wash SPIE c2002Description: viii, 192 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.36 DOP (Browse shelf(Opens below))	Available		417463

Includes bibliographical references and index

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