Optical metrology : proceedings of a conference held 18-19 July, 1999, Denver, Colorado Ghanim A. Al-Jumaily, editor ; sponsored by SPIE - The International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE Optical Engineering Press 1999Description: vi, 276 p. : ill. ; 26 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 AL (Browse shelf(Opens below))	Available		278345

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