Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany Peter H. Lehmann, editor ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e. V. (Germany)

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Publication details: Bellingham, WA SPIE 2009Description: 2 v. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	670.425 LEH (Browse shelf(Opens below))	Available		423050
Anna Centenary Library	670.425 LEH (Browse shelf(Opens below))	Available		423051

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Previous	670.425 HUN Machine vision applications in industrial inspection X : 21-22 January 2002, San Jose, [California] USA	670.425 KUJ Optical measurement systems for industrial inspection : 16-17 June, 1999, Munich, Germany	670.425 LEH Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany	670.425 LEH Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany	670.425 MAR Polarization and color techniques in industrial inspection : 17-18 June 1999, Munich, Germany	670.425 MER Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA	670.425 MIL Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts	Next

Includes bibliographical references and author index

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