Optical constants of materials for UV to x-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA Regina Soufli, John F. Seely, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

Contributor(s):

Seely, John F
Soufli, Regina
International Symposium on Optical Science and Technology (2004 : Denver, Colo. ), Society of Photo-optical Instrumentation Engineers

Publication details: Bellingham, WA SPIE c2004Description: x, 172 p. : ill. ; 28 cmISBN:

9780819454768

ISSN:

2005298511

Subject(s):

Optical constants - Congresses
Refractive index - Measurement - Technique - Congresses
Thin films - Optical properties - Congresses

DDC classification:

530.4175 SOU

Item type: Books

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Holdings
Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	530.4175 SOU (Browse shelf(Opens below))	Available		422894

This conference was part of the program on X-Ray Systems and Technologies at SPIE's 49th Annual Meeting in Denver, Colorado. Includes bibliographical references and author index

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Optical constants of materials for UV to x-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA Regina Soufli, John F. Seely, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

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