Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors Masashi Suezawa, Hiroshi Katayama-Yoshida

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Publication details: Switzerland Trans Tech Publications 1992Description: 1107 p. : ill. ; 24 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.38152 SUE (Browse shelf(Opens below))	Available		388050
Anna Centenary Library	621.38152 SUE (Browse shelf(Opens below))	Available		388051

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