Non-intrusive inspection technologies II : 14 April 2009, Orlando, Florida, United States Brandon W. Blackburn, editor ; sponsored and published by SPIE

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Publication details: Bellingham, WA SPIE 2009Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 BLA (Browse shelf(Opens below))	Available		423843

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Previous	681.25 BER Optical sensors 2008 : 7-10 April 2008, Strasbourg, France	681.25 BER Videometrics VIII : 18-20 January 2005, San Jose, California, USA	681.25 BER Advanced focal plane arrays and electronic cameras II : 18-19 May, 1998, Zurich, Switzerland	681.25 BLA Non-intrusive inspection technologies II : 14 April 2009, Orlando, Florida, United States	681.25 BOS Modeling aspects in optical metrology II : 15-16 June 2009, Munich, Germany	681.25 BRO Advances in photodetectors	681.25 BUR Hard x-ray and gamma-ray detector physics VI : 3-4 August, 2004, Denver, Colorado, USA	Next

Includes bibliographical references and author index

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