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Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport beach, USA Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Contributor(s): Publication details: Bellingham, WA SPIE 2002Description: ix, 228 p. : ill. ; 28 cmISBN:
  • 9780819444516
ISSN:
  • 2002726813
Subject(s): DDC classification:
  • 620.5 MEY
Item type: Books
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