Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain François Danneville ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEDO--Sociedad Española de Óptica (Spain)

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Publication details: Bellingham, WA SPIE c2004Description: xxxi, 588 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.38224 DAN (Browse shelf(Opens below))	Available		423838

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Previous	621.38224 BEN Advances in network and acoustic echo cancellation	621.38224 CAR The technician's EMI handbook : clues and solutions	621.38224 CHR Principles and techniques of electromagnetic compatibility	621.38224 DAN Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain	621.38224 DEE Noise in devices and circuits : 2-4 June, 2003, Santa Fe, new Mexico, USA	621.38224 DEM Analysis and simulation of noise in nonlinear electronic circuits and systems	621.38224 ELL Electrical interference handbook	Next

Includes bibliographical references and author index

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