Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California Geoffrey T. Burnham ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE 2000Description: viii, 320 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.366 BUR (Browse shelf(Opens below))	Available		423717

Includes bibliographical references and index

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