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Journey to data quality Yang W. Lee ... [et al.]

By: Publication details: Cambridge, MA MIT Press 2006Description: xii, 226 p. : ill. ; 24 cmISBN:
  • 9780262122870
ISSN:
  • 2006043331
Subject(s): DDC classification:
  • 658.4038 LEE
Item type: Books
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Includes bibliographical references (p. [215]-221) and index

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