Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States Michael T. Postek, John A. Allgair, editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States)

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Publication details: Bellingham, WA SPIE 2009Description: ix, 1 v. (various pagings) : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	620.5 POS (Browse shelf(Opens below))	Available		424069

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Includes bibliographical references and index

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