Influence of temperature on microelectronics and system reliability Pradeep Lall, Michael G. Pecht, Edward B. Hakim

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Publication details: Boca Raton, FL CRC Press c1997Description: 307 p. : ill. ; 26 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.381046 LAL (Browse shelf(Opens below))	Available		145046

Includes bibliographical references (p. [257]-291) and index

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