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Hot-carrier effects in MOS devices Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada

By: Contributor(s): Publication details: Amsterdam ; Boston Elsevier / Academic Press c1995Description: xii, 312 p. : ill. ; 24 cmISBN:
  • 9780126822403
ISSN:
  • 95030713
Subject(s): DDC classification:
  • 537.6225 TAK
Item type: Books
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