High resolution x-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner

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Publication details: London Taylor & Francis c1998Description: x, 252 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	548.83 TAN (Browse shelf(Opens below))	Available		176932

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Previous	548.83 MOR Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects	548.83 OOI Principles of x-ray crystallography	548.83 SNY Defect and microstructure analysis by diffraction	548.83 TAN High resolution x-ray diffractometry and topography	548.83 WAR X-ray diffraction	548.83 WEL Diffuse x-ray scattering and models of disorder	548.83 WOO Physical and non-physical methods of solving crystal structures	Next

Includes bibliographical references and index

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