Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE c1999Description: vii, 252 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	670.425 MIL (Browse shelf(Opens below))	Available		423993

Includes bibliographical references and index

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