Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA Emile J. Knystautas, Wiley P. Kirk, Valerie Browning, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE c2001Description: ix, 192 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.38152 KNY (Browse shelf(Opens below))	Available		417708

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Previous	621.38152 KIT Beam injection assessment of defects in semiconductors : proceedings of the 5th international workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98), held in Park hotel Schloss Wulkow near Berlin, Germany, August 30-september 3, 1998	621.38152 KIT Gettering and defect engineering in semiconductor technology XIII : GADEST 2009 : proceedings of the XIIIth international autumn meeting, Dölnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009	621.38152 KIT Gettering and defect engineering in semiconductor technology: Gadest '95 : held in Parkhotel Schloss Wulkow, near Berlin, Germany, September 02-07, 1995	621.38152 KNY Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA	621.38152 KOR Heterostructure epitaxy and devices--HEAD '97	621.38152 KOT Atomistic aspects of expitaxial growth	621.38152 KRA Positron annihilation in semiconductors : defect studies	Next

Includes bibliographical references and index

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