Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE 2006Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	670.425 MER (Browse shelf(Opens below))	Available		423960

At head of title: Proceedings of electronic imaging science and technology. Includes bibliographical references and author index

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