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Multi-chip module test strategies edited by Yervant Zorian

Contributor(s): Publication details: Deventer, The Netherlands ; Boston, MA Kluwer 1997Description: 166 p. : ill. ; 27 cmISBN:
  • 9780792399209
ISSN:
  • 97008206
Subject(s): DDC classification:
  • 621.381046 ZOR
Item type: Books
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Holdings
Current library Call number Status Date due Barcode
Anna Centenary Library 621.381046 ZOR (Browse shelf(Opens below)) Available 317797

Includes bibliographical references and index

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