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Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland

By: Contributor(s): Publication details: New York Taylor & Francis 2001Edition: 3rd edDescription: x, 251 p. : ill. ; 24 cmISBN:
  • 9780748409686
ISSN:
  • 37716
Subject(s): DDC classification:
  • 502.825 GOO
Item type: Books
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