Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA Alexander Starikov, Kenneth W. Tobin, Jr., chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Contributor(s):

Publication details: Bellingham, Wash SPIE c2002Description: xv, 628 p. : ill. (some col.) ; 28 cmISBN:

ISSN:

Subject(s):

DDC classification:

Item type: Books

Tags from this library: No tags from this library for this title.

Average rating: 0.0 (0 votes)

Holdings
Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.3672 STA (Browse shelf(Opens below))	Available		276965

Previous								Next
Previous	621.3672 JAC Thermal infrared characterization of ground targets and backgrounds	621.3672 LON Infrared and photoelectronic imagers and detector devices : 31-July-1 August, 2005, San Diego, California, USA	621.3672 LON Infrared and photoelectronic imagers and detector devices II : 13-14 August, 2006, San Diego, California, USA	621.3672 STA Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA	621.3673 HAL Industrial radiology : theory and practice	621.3674 VIJ Optical data storage 2004 : 18-21 April, 2004, Monterey, California, USA	621.3675 BEN Practical holography XII : 26 January 1998, San Jose, California	Next

Includes bibliographical references and index

There are no comments on this title.

to post a comment.

Find us on the map