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Delay fault testing for VLSI circuits Angela Krstić, Kwang-Ting (Tim) Cheng

By: Contributor(s): Publication details: Dordrecht ; Boston Kluwer Academic Publishers 1998Description: xii, 191 p. : ill. ; 24 cmISBN:
  • 9780792382959
ISSN:
  • 98039137
Subject(s): DDC classification:
  • 621.381548 KRS
Item type: Books
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Includes bibliographical references (p. [173]-188) and index

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