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Defects in microelectronic materials and devices edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf

Contributor(s): Publication details: Boca Raton, FL CRC Press 2009Description: xvi, 753 p. : ill. ; 26 cmISBN:
  • 9781420043761
ISSN:
  • 2008018722
Subject(s): DDC classification:
  • 621.381 FLE
Item type: Books
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