Data-driven methods for fault detection and diagnosis in chemical processes Evan Russell, Leo H. Chiang and Richard D. Braatz

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Publication details: Berlin Springer 2000Description: xiii, 192 p. : ill. 25 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	660.2815 RUS (Browse shelf(Opens below))	Available		289777

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Previous	660.2815 PUI European symposium on computer-aided process engineering-15 : 38th European symposium of the working party on computer aided process engineering : eSCAPE-15, 29 May - 1 June 2005, Barcelona, Spain	660.2815 PUI European symposium on computer-aided process engineering-15 : 38th European symposium of the working party on computer aided process engineering : eSCAPE-15, 29 May - 1 June 2005, Barcelona, Spain	660.2815 REA Process intensification : engineering for efficiency, sustainability and flexibility	660.2815 RUS Data-driven methods for fault detection and diagnosis in chemical processes	660.2815 SEB Process dynamics and control	660.2815 SMI Advanced process control : beyond single-loop control	660.2815 SPE Process technology systems	Next

Includes bibliographical references (p. [175]-187) and index

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