Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA Iraj Emami, Kenneth W. Tobin, Jr. ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMATECH, Inc

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Publication details: Bellingham, WA SPIE c2006Description: 1 v. (in various pagings) : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	629.895 EMA (Browse shelf(Opens below))	Available		276932

Includes bibliographical references and author index

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