Chromatic monitoring of complex conditions edited by Gordon Rees Jones, Anthony G. Deakin, Joseph W. Spencer

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Publication details: Boca Raton, FL CRC Press c2008Description: 281 p., [16] p. of plates : ill. (some col.) ; 25 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 JON (Browse shelf(Opens below))	Available		150030

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Previous	681.25 JAM Hard x-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado	681.25 JAM X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA	681.25 JAR Optical security and safety : 11-12 December, 2003, Warsaw, Poland : SOS'03	681.25 JON Chromatic monitoring of complex conditions	681.25 KAL Optoelectronic and electronic sensors V : 5-8 June, 2002, Rzeszów, Poland	681.25 KLE Ultrafast x-ray detectors, high-speed imaging, and applications : 31 July--1 August and 4 August 2005, San Diego, California, USA	681.25 KUL Optoelectronic information systems and processing : papers from selected sessions of the first Asia-Pacific conference on fundamental problems of opto- and microelectronics : 11-15 September 2000, Vladivostok, Russia	Next

Includes bibliographical reference and index

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