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Charged particle detection, diagnostics, and imaging : 30 July-2 August 2001, San Diego, USA Olivier Delage, Eric Munro, John A. Rouse, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Contributor(s): Publication details: Bellingham, Wash SPIE c2001Description: ix, 236 p. : ill. ; 28 cmISBN:
  • 9780819442246
ISSN:
  • 2002280116
Subject(s): DDC classification:
  • 621.484 DEL
Item type: Books
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