Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 editors: Hajime Tomokage and Takashi Sekiguchi

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Publication details: Uetikon-Zuerich, Switzerland Scitec Publications 2001Description: xiii, 441 p. : ill. ; 25 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.38152 TOM (Browse shelf(Opens below))	Available		387567

Includes bibliographical references and index

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