Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.]

Contributor(s):

Publication details: Bellingham, WA SPIE c1999Description: v, 186 p. : ill. ; 28 cmISBN:

ISSN:

Subject(s):

DDC classification:

Item type: Books

Tags from this library: No tags from this library for this title.

Average rating: 0.0 (0 votes)

Holdings
Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.381 GOR (Browse shelf(Opens below))	Available		277420

Includes bibliographical references and index

There are no comments on this title.

to post a comment.

Find us on the map