Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany Christophe Gorecki, Werner P.O. Jüptner, Malgorzata Kujawińska, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)

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Publication details: Bellingham, WA SPIE c2001Description: v, 176 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	620.0044 GOR (Browse shelf(Opens below))	Available		423902

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Previous	620.0044 GAO Measurement technology and intelligent instruments VIII	620.0044 GER Measurement theory for engineers	620.0044 GHO Measurement and instrumentation : trends and applications	620.0044 GOR Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany	620.0044 GOR Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany	620.0044 JON Jones' instrument technology	620.0044 JON Jones' instrument technology	Next

Includes bibliographical references and index

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