Reflection Electron Microscopy and Spectroscopy for Surface Analysis : (Record no. 597593)

MARC details
000 -LEADER
fixed length control field 00541nam a2200193 a 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 251114s2005##################000#0#eng##
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9780521017954
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.44
Item number WAN
100 1# - MAIN ENTRY--AUTHOR NAME
Personal name Wang, Zhong Lin,
245 10 - TITLE STATEMENT
Title Reflection Electron Microscopy and Spectroscopy for Surface Analysis :
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher Cambridge University Press,
Year of publication 2005.
300 ## - PHYSICAL DESCRIPTION
Number of Pages 460 pages
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Technology & Engineering.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type English Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Full call number Accession Number Price effective from Koha item type
        Anna Centenary Library Anna Centenary Library 14.11.2025 620.44 WAN 193179 14.11.2025 English Books

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