Scanning Probe Microscopy, The Lab on A Tip (Record no. 524203)

MARC details
000 -LEADER
fixed length control field 02099nam a2200217Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240821s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783030370886
Paper back/Hardbound hbk
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Item number MEY
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Meyer, Ernst
245 #0 - TITLE STATEMENT
Title Scanning Probe Microscopy, The Lab on A Tip
Statement of responsibility, etc / Ernst Meyer, Hans J. Hug and Roland Bennewitz
250 ## - EDITION STATEMENT
Edition statement 2nd ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher Springer Nature
Year of publication 2021
Place of publication Switzerland
300 ## - PHYSICAL DESCRIPTION
Number of Pages xiv, 322 p
Other physical details ; ill.
Dimensions ; 24 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographies and index
520 ## - SUMMARY, ETC.
Summary, etc Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Scanning probe microscopy
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Hug, Hans J.
Personal name Bennewitz, Roland
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type English Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Cost, normal purchase price Full call number Accession Number Price effective from Koha item type
        Anna Centenary Library Anna Centenary Library 6TH FLOOR, A WING 25.04.2024 6742.00 621.381 MEY 672049 21.08.2024 Reference

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