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X-ray spectrometry in electron beam instruments (Record no. 413560)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00828nam a2200253Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 191130s1995##################000#0#eng## |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780306448584 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 543.08586 WIL |
| 245 ## - TITLE STATEMENT | |
| Title | X-ray spectrometry in electron beam instruments |
| Statement of responsibility, etc | edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | New York |
| Name of publisher | Plenum Press |
| Year of publication | c1995 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xviii, 372 p. : ill. ; 26 cm |
| 500 ## - GENERAL NOTE | |
| General note | Includes bibliographical references and index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Electron beams - Instruments |
| Topical Term | Electron probe microanalysis |
| Topical Term | X-ray spectroscopy |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Goldstein, Joseph |
| Personal name | Newbury, Dale E |
| Personal name | Williams, David B |
| 991 ## - | |
| -- | 188212 |
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