MARC details
000 -LEADER |
fixed length control field |
00870nam a2200241Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
191130s2003##################000#0#eng## |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781402072352 |
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER |
International Standard Serial Number |
2002043306 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
ACL |
Transcribing agency |
ACL |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3950287 NIC |
100 ## - MAIN ENTRY--PERSONAL NAME |
Personal name |
Nicolici, Nicola |
245 ## - TITLE STATEMENT |
Title |
Power-constrained testing of VLSI circuits |
Statement of responsibility, etc. |
by Nicola Nicolici and Bashir M. Al-Hashimi |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Boston |
Name of publisher, distributor, etc. |
Kluwer Academic Publishers |
Date of publication, distribution, etc. |
2003 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xi, 178 p. : ill. ; 25 cm |
500 ## - GENERAL NOTE |
General note |
Includes bibliographical references (p. 163-173) and index |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Integrated circuits, Very large scale integration - Protection |
|
Topical term or geographic name entry element |
Integrated circuits, Very large scale integration - Testing |
|
Topical term or geographic name entry element |
Semiconductors - Thermal properties |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Al-Hashimi, Bashir |
990 ## - EQUIVALENCES OR CROSS-REFERENCES [LOCAL, CANADA] |
Link information for 9XX fields |
72188ae7ac10000c73205c29be240cda |
991 ## - |
-- |
187375 |