Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA (Record no. 363449)

MARC details
000 -LEADER
fixed length control field 01146nam a2200289Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 191130s2007##################000#0#eng##
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9780819468529
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 681.25 ASS
245 ## - TITLE STATEMENT
Title Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA
Statement of responsibility, etc Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, editors, ; sponsored and published by SPIE
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Bellingham, Wash
Name of publisher SPIE
Year of publication c2007
300 ## - PHYSICAL DESCRIPTION
Number of Pages 1 v. (various pagings) : ill. ; 28 cm
500 ## - GENERAL NOTE
General note Includes bibliographical references and author index
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Laser interferometers - Congresses
Topical Term Measurement - Congresses
Topical Term Measuring instruments - Design and construction - Congresses
Topical Term Optical instruments - Design and construction - Congresses
Topical Term Optical measurements - Congresses
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Assoufid, Lahsen
Personal name Ohtsuka, Masaru
Personal name Takacs, Peter Z
710 ## - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element Society of Photo-optical Instrumentation Engineers
991 ## -
-- 344040
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Full call number Accession Number Price effective from Koha item type
        Anna Centenary Library Anna Centenary Library 17.10.2020 681.25 ASS 276762 17.10.2020 English Books

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