MARC details
000 -LEADER |
fixed length control field |
01654nam a2200265Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
191130s2004##################000#0#eng## |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780819453693 |
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER |
International Standard Serial Number |
2005298703 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
ACL |
Transcribing agency |
ACL |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.381531 TAN |
245 ## - TITLE STATEMENT |
Title |
Photomask and next-generation lithography mask technology XI : 14-16 April, 2004, Yokohama, Japan |
Statement of responsibility, etc. |
Hiroyoshi Tanabe, editor ; sponsored by PMJ--Photomask Japan, BACUS--the international technical group of SPIE dedicated to the advancement of photomask technology, [and] SPIE--The International Society for Optical Engineering ; cooperating organizations, the Institute of Electrical Engineers of Japan ... (et al.) ; co-organized by Yokohama City (Japan) ; published by SPIE--The International Society for Optical Engineering |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Bellingham, WA |
Name of publisher, distributor, etc. |
SPIE |
Date of publication, distribution, etc. |
c2004 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
2 v. (xxxiii, 984 p.) : ill. ; 28 cm |
500 ## - GENERAL NOTE |
General note |
Some earlier proceedings have title: Photomask and X-ray mask technology. Includes bibliographical references and author index |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Integrated circuits - Masks - Congresses |
|
Topical term or geographic name entry element |
Masks (Electronics) - Congresses |
|
Topical term or geographic name entry element |
Microlithography - Congresses |
|
Topical term or geographic name entry element |
Optoelectronic devices - Design and construction - Congresses |
|
Topical term or geographic name entry element |
X-ray lithography - Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Tanabe, Hiroyoshi |
710 ## - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
BACUS (Technical group), Institute of Electrical and Electronics Engineers. Japan Section, Photomask Japan, Semiconductor Equipment and Materials International (Japan), Society of Photo-optical Instrumentation Engineers |
990 ## - EQUIVALENCES OR CROSS-REFERENCES [LOCAL, CANADA] |
Link information for 9XX fields |
b5df18d3ac10000c647cf1d97eb6121c |
991 ## - |
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348962 |