Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States (Record no. 216326)

MARC details
000 -LEADER
fixed length control field 01069nam a2200253Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 191130s2009##################000#0#eng##
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9780819476951
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.5 POS
245 ## - TITLE STATEMENT
Title Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States
Statement of responsibility, etc Michael T. Postek, John A. Allgair, editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States)
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Bellingham, WA
Name of publisher SPIE
Year of publication 2009
300 ## - PHYSICAL DESCRIPTION
Number of Pages ix, 1 v. (various pagings) : ill. ; 28 cm
500 ## - GENERAL NOTE
General note Includes bibliographical references and index
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Microfabrication - Congresses
Topical Term Nanostructured materials - Congresses
Topical Term Nanotechnology - Congresses
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Allgair, John A
Personal name Postek, Michael T
710 ## - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element National Institute of Standards and Technology (U.S.), SPIE (Society)
991 ## -
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Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Full call number Accession Number Price effective from Koha item type
        Anna Centenary Library Anna Centenary Library 13.10.2020 620.5 POS 424069 13.10.2020 English Books

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