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000 -LEADER | |
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fixed length control field | 01069nam a2200253Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 191130s2009##################000#0#eng## |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9780819476951 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 620.5 POS |
245 ## - TITLE STATEMENT | |
Title | Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States |
Statement of responsibility, etc | Michael T. Postek, John A. Allgair, editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States) |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication | Bellingham, WA |
Name of publisher | SPIE |
Year of publication | 2009 |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | ix, 1 v. (various pagings) : ill. ; 28 cm |
500 ## - GENERAL NOTE | |
General note | Includes bibliographical references and index |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical Term | Microfabrication - Congresses |
Topical Term | Nanostructured materials - Congresses |
Topical Term | Nanotechnology - Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Allgair, John A |
Personal name | Postek, Michael T |
710 ## - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | National Institute of Standards and Technology (U.S.), SPIE (Society) |
991 ## - | |
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Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Full call number | Accession Number | Price effective from | Koha item type |
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Anna Centenary Library | Anna Centenary Library | 13.10.2020 | 620.5 POS | 424069 | 13.10.2020 | English Books |