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From contamination to defects, faults, and yield loss : simulation and applications (Record no. 188979)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00965nam a2200253Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 191130s1996##################000#0#eng## |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780792397144 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381520685 KHA |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Khare, Jitendra B |
| 245 ## - TITLE STATEMENT | |
| Title | From contamination to defects, faults, and yield loss : simulation and applications |
| Statement of responsibility, etc | by Jitendra B. Khare, Wojciech Maly |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Dordrecht ; Boston |
| Name of publisher | Kluwer Academic Publishers |
| Year of publication | c1996 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 150 p. : ill. ; 24 cm |
| 500 ## - GENERAL NOTE | |
| General note | Includes bibliographical references and index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Computer-aided design |
| Topical Term | Integrated circuits - Very large scale integration - Computer simulation |
| Topical Term | Integrated circuits - Very large scale integration - Defects |
| Topical Term | Integrated circuits - Very large scale integration - Testing |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Maly, W |
| 991 ## - | |
| -- | 265013 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Full call number | Accession Number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Anna Centenary Library | Anna Centenary Library | 13.10.2020 | 621.381520685 KHA | 317756 | 13.10.2020 | English Books |