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Delay fault testing for VLSI circuits (Record no. 146528)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00788nam a2200229Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 191130s1998##################000#0#eng## |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780792382959 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381548 KRS |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Krstić, Angela |
| 245 ## - TITLE STATEMENT | |
| Title | Delay fault testing for VLSI circuits |
| Statement of responsibility, etc | Angela Krstić, Kwang-Ting (Tim) Cheng |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Dordrecht ; Boston |
| Name of publisher | Kluwer Academic Publishers |
| Year of publication | 1998 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xii, 191 p. : ill. ; 24 cm |
| 500 ## - GENERAL NOTE | |
| General note | Includes bibliographical references (p. [173]-188) and index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Delay faults (Semiconductors) |
| Topical Term | Integrated circuits - Very large scale integration - Testing |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Cheng, Kwang-Ting |
| 991 ## - | |
| -- | 160410 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Full call number | Accession Number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Anna Centenary Library | Anna Centenary Library | 12.10.2020 | 621.381548 KRS | 263674 | 12.10.2020 | English Books |