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Defects in microelectronic materials and devices (Record no. 146317)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00897nam a2200253Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 191130s2009##################000#0#eng## |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781420043761 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381 FLE |
| 245 ## - TITLE STATEMENT | |
| Title | Defects in microelectronic materials and devices |
| Statement of responsibility, etc | edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Boca Raton, FL |
| Name of publisher | CRC Press |
| Year of publication | 2009 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xvi, 753 p. : ill. ; 26 cm |
| 500 ## - GENERAL NOTE | |
| General note | Includes bibliographical references and index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Integrated circuits - Defects |
| Topical Term | Metal oxide semiconductor field-effect transistors - Testing |
| Topical Term | Microelectronics - Materials - Testing |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Fleetwood, D. M |
| Personal name | Pantelides, Sokrates T |
| Personal name | Schrimpf, Ronald Donald |
| 991 ## - | |
| -- | 132640 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Full call number | Accession Number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Anna Centenary Library | Anna Centenary Library | 12.10.2020 | 621.381 FLE | 151636 | 12.10.2020 | English Books |