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CTL for test information of digital ICs (Record no. 142665)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00641nam a2200205Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 191130s2003##################000#0#eng## |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781402072932 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381548 KAP |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Kapur, Rohit |
| 245 ## - TITLE STATEMENT | |
| Title | CTL for test information of digital ICs |
| Statement of responsibility, etc | by Rohit Kapur |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Boston |
| Name of publisher | Kluwer Academic Publishers |
| Year of publication | 2003 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | ix, 173 p. : ill. ; 24 cm. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Computer hardware description languages |
| Topical Term | Digital integrated circuits - Testing - Standards |
| 991 ## - | |
| -- | 283827 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Full call number | Accession Number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Anna Centenary Library | Anna Centenary Library | 12.10.2020 | 621.381548 KAP | 317617 | 12.10.2020 | English Books |