Characterization methods for submicron MOSFETs (Record no. 126714)

MARC details
000 -LEADER
fixed length control field 00743nam a2200217Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 191130s1995##################000#0#eng##
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9780792396956
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815284 HAD
245 ## - TITLE STATEMENT
Title Characterization methods for submicron MOSFETs
Statement of responsibility, etc edited by Hisham Haddara
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Dordrecht ; Boston
Name of publisher Kluwer Academic Publishers
Year of publication 1995
300 ## - PHYSICAL DESCRIPTION
Number of Pages vii, 232 p. : ill. ; 24 cm
500 ## - GENERAL NOTE
General note Includes bibliographical references and index
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Electronic circuit design
Topical Term Metal oxide semiconductor field-effect transistors - Mathematical models
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Haddara, Hisham
991 ## -
-- 189219
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Full call number Accession Number Price effective from Koha item type
        Anna Centenary Library Anna Centenary Library 12.10.2020 621.3815284 HAD 318311 12.10.2020 English Books

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