Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 (Record no. 112674)

MARC details
000 -LEADER
fixed length control field 01127nam a2200241Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 191130s2001##################000#0#eng##
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783908450610
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38152 TOM
245 ## - TITLE STATEMENT
Title Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000
Statement of responsibility, etc editors: Hajime Tomokage and Takashi Sekiguchi
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Uetikon-Zuerich, Switzerland
Name of publisher Scitec Publications
Year of publication 2001
300 ## - PHYSICAL DESCRIPTION
Number of Pages xiii, 441 p. : ill. ; 25 cm
500 ## - GENERAL NOTE
General note Includes bibliographical references and index
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Semiconductors - Defects - Congresses
Topical Term Semiconductors - Microscopy - Congresses
Topical Term Semiconductors - Testing - Congresses
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Tomokage, Hajime
710 ## - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (6th : 2000 : Fukuoka, Japan)
991 ## -
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Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Full call number Accession Number Price effective from Koha item type
        Anna Centenary Library Anna Centenary Library 12.10.2020 621.38152 TOM 387567 12.10.2020 English Books

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