Search the Library Catalogue
000 -LEADER | |
---|---|
fixed length control field | 01127nam a2200241Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 191130s2001##################000#0#eng## |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9783908450610 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.38152 TOM |
245 ## - TITLE STATEMENT | |
Title | Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 |
Statement of responsibility, etc | editors: Hajime Tomokage and Takashi Sekiguchi |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication | Uetikon-Zuerich, Switzerland |
Name of publisher | Scitec Publications |
Year of publication | 2001 |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | xiii, 441 p. : ill. ; 25 cm |
500 ## - GENERAL NOTE | |
General note | Includes bibliographical references and index |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical Term | Semiconductors - Defects - Congresses |
Topical Term | Semiconductors - Microscopy - Congresses |
Topical Term | Semiconductors - Testing - Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Tomokage, Hajime |
710 ## - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (6th : 2000 : Fukuoka, Japan) |
991 ## - | |
-- | 157320 |
Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Full call number | Accession Number | Price effective from | Koha item type |
---|---|---|---|---|---|---|---|---|---|---|
Anna Centenary Library | Anna Centenary Library | 12.10.2020 | 621.38152 TOM | 387567 | 12.10.2020 | English Books |