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Testing Static Random Access Memories : defects, fault models and test patterns

Testing Static Random Access Memories : defects, fault models and test patterns Said Hamdioui - Boston Kluwar Academic Publishers 2004 - xx, 221 p. 24 cm.

Includes index

ISBN: 9781402077524

Subjects--Topical Terms:
Random Access Memory Testing

Dewey Class. No.: 004.53 / HAM

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Testing Static Random Access Memories : defects, fault models and test patterns

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