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Encyclopaedia of measuring technology and mechartronics automation in electrical engineering Fault-Diagnosis applications: model-based condition v. 3

Suzuki, Satoshi

Encyclopaedia of measuring technology and mechartronics automation in electrical engineering Fault-Diagnosis applications: model-based condition v. 3 Contributors Satoshi Suzuki, Hideki Kakeya, Huaqing Wang, [et al.] - London Auris Reference - x, 261 p. ill. 25 cm.

Edition 2016

Includes bibliographies and index

ISBN: 9781781546239

Subjects--Topical Terms:
Metrology

Dewey Class. No.: 621.3 / SUZ.3

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Encyclopaedia of measuring technology and mechartronics automation in electrical engineering Fault-Diagnosis applications: model-based condition v. 3

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