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Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California

Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California Eiichi Tamiya, Shuming Nie, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society - Bellingham, WA SPIE c1999 - vii, 168 p. : ill. (some col.) ; 28 cm

Includes bibliographical references and index

ISBN: 9780819430779

ISSN: 268728

Subjects--Topical Terms:
Medical electronics - Congresses
Nanotechnology - Congresses
Scanning force microscopy - Congresses
Scanning probe microscopy - Congresses

Dewey Class. No.: 535 TAM

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Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California

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