Normal view MARC view ISBD view

Applied scanning probe methods

Bhushan, Bharat

Applied scanning probe methods Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.] - New York Springer c2004 - xx, 496 p. : ill. ; 24 cm

Includes bibliographical references and index

ISBN: 9783540005278

ISSN: 2003059049

Subjects--Topical Terms:
Materials - Microscopy
Scanning probe microscopy

Dewey Class. No.: 620.11299 BHU

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Applied scanning probe methods

Find us on the map