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Advances in materials characterization
Advances in materials characterization
editors, G Amarendra, Baldev Raj, M H Manghnani ; editor-in-chief, Baldev Raj
- Hyderabad ; Boca Raton Universities Press ; CRC Press 2007
- [iv], 220 p. : ill. (some col.) ; 25cm
Includes bibliographical references and index. Contents:
9781420047295
Materials - Testing.
620.110287 AMA
Includes bibliographical references and index. Contents:
- Introduction to Materials Characterization
- Atomistic Characterization of Materials using Scanning Tunneling Microscopy / Spectroscopy
- Recent Advances in Characterization of Materials using Electron Microscopy
- X-ray Reflectivity: A Non-destructive Technique for the Study of Thin Films and Multilayers
- Latest Trends in Ultrasonic Technique for Materials Characterization
- Characterization of Soft Condensed Matter using Confocal Microscopy
- Characterization of Defects in Semiconductor Devices using Positron Annihilation
- Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering.
9781420047295
Materials - Testing.
620.110287 AMA