Normal view MARC view ISBD view

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA Angela Duparré, Bhanwar Singh, Zu-Han Gu, editors, ; sponsored and published by SPIE - Bellingham, Wash SPIE c2007 - 1 v. (various pagings) : ill. ; 28 cm

Includes bibliographical references and index

ISBN: 9780819468208

ISSN: 2010287972

Subjects--Topical Terms:
Nanotechnology - Congresses
Optical measurements - Congresses
Optoelectronic devices - Congresses
Optoelectronics - Congresses
Semiconductors - Characterization - Congresses
Thin films - Optical properties - Congresses

Dewey Class. No.: 621.381045 DUP

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA

Find us on the map