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Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA Angela Duparré, Bhanwar Singh, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.] - Bellingham, Wash SPIE c2002 - viii, 192 p. : ill. ; 28 cm

Includes bibliographical references and index

ISBN: 9780819445469

ISSN: 2003535275

Subjects--Topical Terms:
Information storage and retrieval systems - Congresses
Metrology - Congresses
Optical materials - Congresses
Semiconductors - Characterization - Congresses

Dewey Class. No.: 621.36 DOP

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Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA

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